What is the flicker test system

A CIE TN006-2016 CIE SVM certified flicker test system. The harmonics and the flicker analyzers use alternating current (AC) sources with peak current ratings of up to 3 seconds and low source impedances. With its dual-processor design and multi-tasking kernel, the system also allows for continuous monitoring and precise measurement in real-time.

What is the flicker test?
This testing technique is used to determine the degree to which flicker is produced by lighting systems, which may consist of the following components: lamps, light sources, transformers, ballasts, or drivers, and dimming controllers.
Signal processing is used to get rid of high-frequency components over the cut-off frequency.

Description
Transients in harmonics and flickers may be detected and monitored using harmonics and flicker analyzers. Power grids are vulnerable to electrical disturbances like flicker and harmonics. Alternating currents may cause minimal voltage fluctuations in the main supply via their interaction with the impedance of the grid.
Incandescent bulbs produce flicker due to fluctuations in light output. Distortion in the power supply causes harmonics because it causes loads to draw current that is not perfectly sinusoidal. Overheating cables and transformers may result from harmonics if not mitigated.
It is possible to detect and fix problems caused by electrical fluctuations like flickering and harmonics with the help of a specialized testing solution.

Figure 1: Flicker test system

Equipment Combinations
The results of the tests that were assessed using this approach are unique to each combination of the following:
1) Source of illumination with an appropriate dimmer; or
2) Lamp with low voltage together with an example of a representative transformer and, if required, an example of an example dimmer; or
3) Light source with an appropriate dimming control (if one is required); alternatively:
4) The light source in conjunction with a representative driver and, if required, a representative dimming control; or
5) Luminous source accompanied with a representation ballast and a representative dimmer control (if applicable).
To simulate a larger load for the control or transformer, several units of the unit under test with identical light sources, and ballasts or drivers, as appropriate, will be connected to the same circuit and given the control signal. A phase cut dimmer’s flicker readings with one line voltage incandescent bulb are to be taken as indicative for that dimmer with any such light.
Measurements of flicker taken with a phase cut dimmer regulating a transformer for low voltage incandescent lights should be taken as typical exclusively of that dimmer/transformer/lamp combination.
All non-incandescent light sources controlled by a phase cut dimmer will have the same measured flicker if they use the same phase cut dimmer, ballast, driver, and bulb. These findings are specific to the tested dimmer, ballast, driver, and bulb configuration.
The flicker measurement of light sources controlled by 0–10-volt, digital, wireless, or powerline carrier control is specific to that combination of a control type and ballast or driver and lamp. This is because flicker is caused by an interaction between the ballast or driver and the lamp.
The findings of the tests performed on the lamp and ballast, or driver combination may be extrapolated to be used with other systems that use another control of the same kind (0-10 volt, digital, etc.) to provide the control signal.

How does flicker occur?
LED devices often exhibit flicker because of the specific architecture of the light source. This is the cause of the flicker. It is also possible for it to originate from the natural environment, such as the sun flashing between various things while the person is driving.
Flicker test system is a kind of temporal light modulation (TLM), which may significantly impact the dynamic of a scene and the performance of a camera or sensor. Flickering can also substantially change the appearance of an image.

Test Equipment Requirements
Test enclosure: To verify that the measured light is exclusively coming from the UUT, the test container does not let any ambient light in (unit under test). The test container must be able to maintain a temperature of 25 degrees Celsius, give or take 5 degrees, and preparations need to be done for it.
Device for gathering data: The light output waveform must be monitored using a photodetector that has a rise time of no more than 10 microseconds, together with a trans-impedance amplifier and an oscilloscope.
It is possible to use a different measuring system so long as it can perform the same functions and maintain the same level of precision as the required apparatus.
The system’s temporal responsiveness, amplification, and filtering features must be designed to record photometric data at intervals of 50 microseconds or less, equating to a data recording rate of no less than 20 kHz, and must be capable of recording at least one second’s worth of data.

Flicker Test Conditions
Product wiring setup: The wiring of fluorescent ballasts must adhere to the specifications in the luminous efficiency test process.
Product pre-conditioning: At least one hundred hours of “seasoning” (full-output operation) of all fluorescent bulbs is required before the test can begin. Other lamp kids do not need to be seasoned.
Input power: The UUT’s (unit under test) input power must be at the rated primary voltage and frequency, to within 0.5% for both. Ballasts rated with various primary voltages should only be used at the voltage specified for their main use. The voltage should look like a sinusoid, and its total harmonic distortion (THD) shouldn’t be more than 3%.
Temperature: The temperature should be kept at 25 degrees Celsius.
Dimming levels: Light levels at 100%, 20%, and the lowest dimming level must all be measured to within 2% of their respective full light outputs, with 100% full light output defined as running the light source at its brightest setting allowed by the control.
When measuring flicker, it is best to measure at the lowest possible light level, which is often higher than 20% of the maximum. Dimming levels for fluorescent ballast testing may be determined using lamp arc power as a surrogate for actual light output.

Test Procedure
Lamplight: The lamp’s light output must be regulated before it can take any measurements at different dimming levels. If the difference between two consecutive measurements performed at one-minute intervals does not exceed 0.5%, then the light output is deemed stable.
Recording Interval: The data that has been measured must be recorded to a digital file with an interval between each measurement of no more than 0.00005 seconds (50 microseconds), which corresponds to a tool measurement rate of no less than 20kHz. Additionally, it must capture at least one second of data.
Record illumination measurements (in footcandles or volts) from test equipment after the bulbs have stabilized for each degree of dimming. The gap between readings should not be more than 50 microseconds. These measurements must be documented throughout testing at least one second long.
LISUN  provides the best flicker test system in the world.

The importance of testing flicker
Light flickering may impact almost all sectors that depend on cameras and sensors, although its manifestation is most noticeable in the automobile and security sectors. Because of the dynamic nature of the locations in which these businesses operate, it is not uncommon for there to be flickering lights.
A variety of different lighting conditions causes this. However, to guarantee both great performance and safety, the camera and sensor systems will need to be able to adjust to the many conditions that may arise. To prevent a potentially hazardous condition for drivers, a system such as an LSRF-3 flicker test system must always respond appropriately, even when the light flickers inconsistently.

Features
Here you will find some of the best features of the flicker test system.

PC doesn’t require
Without needing a personal computer, you can carry out a variety of testing procedures by using just this one device. These procedures include establishing test conditions, carrying out tests, comparing test results to limit values, and generating result reports. On the gadget’s screen, the pass/fail results and the spectrum data are shown in real-time. You can build up an intuitive testing system in which the control panel of this apparatus may serve as the primary console.

Easy-to-view screen and real-time measurement
The flicker test equipment LSRF-3 has a TFT color liquid crystal display. You can get a fast understanding of the current condition of the EUT thanks to the graphical representation that it provides of the different data. In addition, it has a real-time measurement feature that enables the user to create and alter test conditions while the measurement is being taken.
In many traditional testing systems, measuring and determining whether something passes or fails are treated as two independent processes, and it often takes some time before test results are provided.
On the other hand, LSRF-3 allows you to see the impact of your trial-and-error effort on the circuit in real-time while also modifying the judgment criteria. This makes locating and resolving issues throughout the development stage a straightforward process.

Easy test condition setting
It is simple to set up test settings that are suitable for the piece of equipment being evaluated (EUT). You can store the established test circumstances in a file, making it simple to run tests under the same settings repeatedly.
Additionally, you can reuse the saved test conditions for additional tests, with some of the parameters being altered. In situations such as when you wish to perform tests on numerous EUTs under identical settings, this provides a quick condition setup for the test. In addition to that, it helps cut down on errors made while establishing conditions.

Easy connection
The power source and load terminals are cleanly segregated from one another. Because the terminals are arranged this way, you won’t have to stress making a connection error that may result in a short circuit. It should be no surprise that voltage sensing is also provided for the load terminals. The LSRF-3 flicker test system is designed to be easy to use while still being expandable.

Support for test repeatability checking
You can check to see whether the margin of error is within the acceptable range by comparing the measurement data you have just acquired with the measurement data you have previously collected.
The evaluation of “repeatability,” which is necessary for checking harmonic compliance, may be aided by using this function.

Lisun Instruments Limited was found by LISUN GROUP in 2003. LISUN quality system has been strictly certified by ISO9001:2015. As a CIE Membership, LISUN products are designed based on CIE, IEC and other international or national standards. All products passed CE certificate and authenticated by the third party lab.

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