What is a test pin and what is its main function

Test pin, also known as probe, is an essential component in precision electrical testing. In the process of electronic circuit research and production, it is often necessary to test and analyze signal connectivity and quality. At this time, precision test pins are used to extract the signal without damage and provide it to the corresponding ICT or testing system for comprehensive analysis. The quality of the test pin greatly affects the accuracy and repeatability of the test. According to the application field, test pins are divided into conventional ICT probes, semiconductor test probes, RF high-frequency test probes, high-current probes, and battery contact probes. According to the structure of the probe, it can also be divided into conventional single-head spring pins, double-head BGA test pins, and needle sleeve adapter double-head pins. In the early stage of probe selection, several key parameters need to be considered, including the spacing of the test pins, the appropriate head type for the object being tested, the current carrying capacity, the movement stroke, and the required spring force.

SMT BS01_AL

Probe is a high-end precision electronic component that is mainly used in electronic products such as mobile phones to establish connections. The test probe mentioned in the article is like a medium that can be used to touch the test object with the head of the probe, while the other end is used to transmit signals and carry current. There are various types of heads for probes, such as sharp, serrated, and flat heads, which can be used for different test points. Probes are mainly used in electronic products such as mobile phones to establish connections. They are also used in IC test fixtures, adapter boards, and aging seats to test modules such as battery, screen, camera, BTB/FPC. There are two types of test probes for IC chips: solder ball test and non-solder ball test. The former uses claw probes to directly contact the solder ball, while the latter uses pointed probes to contact the PAD. Common probes are made of beryllium copper and plated with nickel. They consist of four parts: needle, needle tube, needle tail, and piano wire.

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