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Home Products IEC 61032 Standard Articulated Test Probe with 10N Thrust
IEC 61032 Standard Articulated Test Probe with 10N Thrust IEC 61032 Standard Articulated Test Probe with 10N Thrust
IEC 61032 Standard Articulated Test Probe with 10N Thrust IEC 61032 Standard Articulated Test Probe with 10N Thrust

IEC 61032 Standard Articulated Test Probe with 10N Thrust

Product No: SMT-02T10

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  • Description

  • IECStandard Articulated Test Probe is a precision test probe made according to Figure 2 (Fig. 2) of the IEC61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL. IEC60335, IRAM 4220-1 and in most of the rules involved in the verification of accessibility to live parts.

    The Jointed Test Finger was made on stainless steel and Polyamide handle.

    Material: Stainless Steel.
    Handle: Polyamide.
    Finish: Chrome plating.
    According to: IEC61032, IEC60335-1, IEC60529-2001, IRAM 4220-1, SASO/IEC60335-1, SASO IEC60950, IEC60950/EN60950.
    Thrust: 10N

    IEC 61032 Standard Articulated Test Probe with 10N Thrust

    IEC 61032 Standard Articulated Test Probe with 10N Thrust

     

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